Fujitsu Secured MCU MB90F345CAPF-G Heximal Code Restoration starts from attacking IC processor MB90F345 protection and readout microprocessor MB90F345 flash memory program;
CMOS IC chips may suffer latch-up under the following conditions:
A voltage higher than VCC or lower than VSS is applied to an input or output
A voltage higher than the rated voltage is applied between VCC and VSS
The AVCC power supply is applied before the VCC
Latch-up may increase the power supply current drastically, causing thermal damage to the device.
For the same reason, also be careful not to let the analog power-supply voltage (AVCC, AVRH) exceed the digital power-supply voltage.
Leaving unused input pins open may result in misbehavior or latch-up and possible permanent damage to the device. Therefore they must be pulled up or pulled down through resistors. In this case those resistors should be more than 2 kL .
Unused bidirectional pins should be set to the output state and can be left open, or the input state with the above described connection.
If there are multiple VCC and VSS pins, that are designed to be set to the same potential are connected the inside of the device to prevent malfunctions such as latch-up.
To reduce unnecessary radiation, prevent malfunctioning of the strobe signal due to the rise of ground level, and observe the standard for total output current, be sure to connect the VCC and VSS pins to the power supply and ground externally. Connect VCC and VSS pins to the device from the current supply source at a low impedance.
Connect the mode pins directly to VCC or VSS pins. To prevent the device unintentionally entering test mode due to noise, lay out the printed circuit board so as to minimize the distance from the mode pins to VCC or VSS pins and to provide a low-impedance connection.